Application Notes
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Amicus Applications
A High Speed Etching Source for Depth Profiling
Characterisation of Car Exhaust Catalysts
Depth Profile through a TiN/SiO2 film on Si
Hard Disk Concentration Depth Profile
Axis Applications
XPS Analysis of Polymer Blends. (AXIS HSi)
Segregation phenomena in a model adhesive formulation. (AXIS 165)
Valence band spectra for the determination of polymer tacticity. (AXIS 165)
A Dual Anode Monochromatic X-ray Source. (AXIS Ultra)
Changes in the Al Surface upon Exposure to Ambient Conditions. (AXIS Ultra)
Plasma Polymer Coatings in Aluminium-Epoxy Adhesive Joints. (AXIS Ultra)
Polymer Handbook
Axis 165 Polymer Handbook on disk
Axis 165 Polymer Handbook on paper
An (e-mailed) password for the PDF download
General Concepts
Vison 2 data processing
Charge neutralisation
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