Compact, Versatile XPS Analysis

Routine XPS Analysis The high efficiency energy dispersive analyser of the AMICUS means that a high sample throughput is easily obtained. Even valence band spectroscopy is possible in a matter of minutes. In this example two hydrocarbon polymers, polystyrene and polyethylene, were examined. Analysis of the C ls core level reveals only minor differences. The valence band spectra (left) show that each polymer has a characteristic "fingerprint" associated with subtle changes in bonding of the valence electrons of the C 2p and C 2s levels, enabling easy identification.

 

Process Control - Analysis of Palladium Catalysts Many industrial processes rely upon the surface chemical properties of materials. The performance of Pd based catalysts for example is directly related to their surface properties. Pd pellets have been taken from the reaction vessel at various stages of their active lifetime. As the lifetime increases activity decreases, XPS analysis of the Pd 3d core level reveals a gradual dominance of the surface oxide. Regeneration can reactivate the Pd pellet via reduction of the oxidised surface as shown by sample E. The AMICUS is ideally suited to this type of analysis, using its standard fully automated batch analysis capability.
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Quality Control - Chemical State Profiling Combining XPS analysis with the ion sputter gun of the AMICUS can provide depth dependent chemical state information. Here two Si samples were heat treated for 2 min (Sample A) and 15 min (Sample B) respectively in an oxidising atmosphere. The powerful data interpretation facilities available enable an oxide and metallic Si component to be extracted from the Si 2p feature and then plotted as a function of depth. It is clear that the SiO2/Si interface has extended from ~10 nm to ~15 nm with the prolonged heat treatment.

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