AXIS HS

AXIS HS
The High Performance XPS Instrument

This instrument offers an excellent price/performance capability. It is designed around a 127mm mean radius hemispherical analyzer, equipped with a triple channeltron detection system for improved sensitivity. The instrument also features the patented magnetic immersion lens for superior sensitivity at small analysis areas. A standard feature is XPS Imaging, down to the 30 micron level. Included is the patented charge neutralization system that enables high resolution spectra to be obtained from insulating materials with ease, working with both the standard Mg/Al source as well as the Al monochromatic source. A range of options are available that provide for an automated multi-sample capability, as well as various accessories and pumping options. The instrument is controlled by the VISION data system, which utilizes a SUN computer workstation, and a Windows like operating system, emphasizing a Graphical User Interface for ease of use.

For even higher performance, take a look now at AXIS HSi, which also adds more functionality to the AXIS range, and AXIS Ultra, the high performance imaging XPS system.

	Copyright © Kratos 1998 Last Update: 98/4/10 Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation.
For comments, suggestions, contributions or an Instrument Demonstration e-mail to: dsurman@kratos.com

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