AXIS HSi

AXIS HSi
The Extended Performance XPS Instrument

The AXIS HSi offers an enhanced XPS capability over the AXIS HS. It uses the same 127mm hemispherical analyzer, however the detection system is upgraded to a five channeltron system. This offers increased spectroscopic sensitivity for small area analysis. The Magnetic Immersion Lens is used to provide high sensitivity all the way down to the smallest spot size of 30 microns. XPS imaging is a standard feature, along with the integrated, patented charge neutralization system. The instrument is available in a variety of configurations, that allow for flexibility to address different applications needs, such as automated analysis or fundamental research applications. The instrument is controlled by VME based digital electronics that allow flexibility in instrument tuning and optimization. These are controlled by the SUN computer based VISION data system. The software incorporated is highly graphically based, and interactive. It is easy and intuitive to use, and provides excellent flexibility in data acquisition setup and processing.

Take a look now at AXIS 165, which adds more functionality and more performance to the AXIS range, and AXIS Ultra the imaging system with all the advantages of the 165.

	Copyright © Kratos 1999 Last Update: 99/02/22 Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation.
For comments, suggestions, contributions or an Instrument Demonstration e-mail to: dsurman@kratos.com

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