Kratos logoAXIS Applications rule
.


 
 
 

Determination of the structure of HMDSO/O2 plasma deposits using high resolution XPS

 
 
 

Graphs ("Figures 5 & 6")

 
 
Please read the introductory notes at the head of "Figure 3", if you haven't already done so.


 
 
Fig. 5

Proportion of silicon in each environment - see Table 1 for detailed peak assignment.


.
 
 
Fig. 6

Composition of HMDSO plasma deposits as a function of the oxygen flow into the plasma, determined by XPS and displayed as atomic ratios.

Back to the text
-[ Figure 3 ]-[ Figure 4 ]-

rule

[top] spacer
Copyright © Kratos 1998
Last Update: 98/4/14

Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation.

index

For comments, suggestions, contributions or an Instrument Demonstration
e-mail to: dsurman@kratos.com
spacer

This an Acolyte site design.