High Performance Imaging XPS - Overview

The AXIS line of multi-technique photoelectron spectrometers provides scientists with unsurpassed performance in the areas of high energy and spatial resolution, high sensitivity, time efficiency and ease of use.

AXIS ULTRA

is the latest in our series of high performance XPS instruments.

The system's many points of excellence include these outstanding performance characteristics -

High Energy Resolution and Charge Neutralisation

XPS is a powerful technique tor the detection of variations in chemical composition and oxidation state. Subtle changes in peak positions and shape can yield important information on changes in surface chemistry. AXIS Ultra provides a high energy resolution capability for both conductive and insulating samples through the incorporation of the Kratos patented charge neutralisation system The adjacent spectrum of PET illustrates the benefit of the neutralisation system with a resolution of 0.65eV on the C-OO ester peak at 288 4eV.

Fast Parallel Imaging

The incorporation of the patented spherical mirror analyser in conjunction with the standard hemispherical system in the AXIS Ultra provides the ability to obtain not only high spatial resolution imaging, but also a real-time parallel detection facility that allows high quality chemical images to be obtained in only a few seconds. The images (shown right) of the Cu 2p_3/2 peak obtained from a standard TEM grid illustrate the effect of a 1, 5, 10 and 20 second acquisition time on the signal to noise ratio and image quality. The real time imaging capability of the Ultra reduces the sample setup time and significantly reduces the image acquisition time. This ultimately leads to improved data quality and a greater sample throughput.

Multi-point Spectroscopy

A key feature of an XPS instrument is the ability to obtain spectroscopic information from a selected area of a sample without the need to translate the specimem.The ability to obtain a fast parallel chemical image which can be used as a reference to perform spectroscopic analysis is an integral part of the AXIS Ultra system The incorporated electrostatic deflection system allows easy multi-point analysis to be carried out from within the imaged field of view. The example shown left is of a ZnS based phosphor coating on glass. The individual spectra were acquired from the indicated positions and clearly differentiate between the various components of the phosphor. The ability to obtain data over a large field of view while maintaining photoelectron and Auger peak positions is especially important .

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	Copyright © Kratos 2003 Last Update:03/08/12 Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation.

For comments, suggestions, contributions or an Instrument Demonstration e-mail to: xps@kratos.com