As well as exhibiting at ECASIA'19 in Dresden (15th - 20th September) our applications specialists and collaborators will be presenting a number of oral contributions at the meeting, which are highlighted below. If you're attending ECASIA'19 please be sure to drop by our exhibition booth where we'll be demonstrating the latest version of ESCApe, our acquisition and processing software.
For Kratos Users' attending the meeting, we'll be hosting our popular Users' Dinner on Tuesday 17th September. We'll be sending out invites with further details very soon.
We hope that you'll be able to make it to the exhibition and some of our oral contributions;
A Multi-Technique Approach for a Complete Thin Film Characterisation
Monday 16th September, 2:10PM (Hall 2)
Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources
Monday 16th September, 2:10PM (Konferenz 4)
A novel, combined XP image and spectroscopic depth profile investigation of extended release pharmaceutical tablets
Tuesday 17th September, 11:00AM (Konferenz 2-3)
Combinatorial Group XPS Analysis of Novel Material Systems
Thursday 19th September, 11:00AM (Konferenz 2-3)
The full programme can be viewed here.