As well as exhibiting at AVS66 International Symposium & Exhibition in Columbus, Ohio (20-15th October) our applications specialists and collaborators will be presenting a number of oral contributions at the meeting, which are highlighted below. If you're attending AVS 66 please be sure to drop by exhibition booth #701 where we'll be demonstrating the latest Windows 10 version of ESCApe, our acquisition and processing software.
For Kratos Users' attending the meeting, we'll be hosting our popular Users' Dinner on Monday 21st October. This is an 'invite only' event for Users of Kratos instruments - if you have not yet received your invitation but are able to attend, please contact us as soon as possible as places are filling up fast!
We hope that you'll be able to make it to the exhibition and some of our oral contributions;
A Multi-Technique Approach for a Complete Thin Film Characterisation
Tue, Oct 22, Room A211, 11:20am - 11:40am
Intensity Calibration and Sensitivity Factors for XPS Instruments with Monochromatic Ag Lα and Al Kα Sources
Mon, Oct 21, Room A211, 11:20am - 11:40am
Surface Characterization of 2D Materials and their 3D Analogues using XPS
Tue, Oct 22, Room A216, 11:40am - 12:00pm
Current Issues and Solutions for Reliable‚ Robust and Reproducible XPS Spectral Acquisition and Data Reporting
Mon, Oct 21, Room A211, 11:00am - 11:20am
The full programme can be searched here.