News

We're hiring!

Published: 
June 17th 2019
We are currently seeking a talented individuals for a number of roles at our Headquarters in Manchester, UK.

Vision 2 on MS Windows 10

Published: 
February 26th 2019
Kratos’ Vision2 acquisition and processing software is now available for Microsoft Windows 10 operating system. With less than a year to end of life for MS Windows 7, now is the perfect time to upgrade to Vision 2 on a Windows 10 PC.

Applications training completed at HarwellXPS

Published: 
February 14th 2019
We recently completed applications training on the AXIS Supra at the EPSRC National Facility for X-Ray Photoelectron Spectroscopy, Harwell, UK. We extremely pleased that we have a Kratos spectrometer at HarwellXPS that can be accessed by UK academics and researchers through EPSRC funding.

AXIS Supra @ Surface Science Western

Published: 
November 29th 2018
Kratos Analytical is extremely pleased to announce that we are continuing our collaboration with Surface Science Western at the University of Western Ontario after completing installation of their AXIS Supra. This is the third Kratos instrument that SSW has purchased after ordering an AXIS Ultra nearly 20 years ago in 2001.

Global Users' Meeting, October 2018

Published: 
October 25th 2018
Short overview of the Global Users' Meeting 2019 hosted at UC Irvine on 19th October. Here we present an overview of the presentations from at the Global Users meeting, attended by 42 Users from 18 institutes.

AXIS Supra makes the news

Published: 
September 20th 2018
Chancellor of the Exchequer, Mr Hammond, is shown the AXIS Supra during his visit to Swansea University. The AXIS Supra was the star of the show when Chancellor of the Exchequer, Mr Hammond, and the Welsh Secretary visited Swansea University in September. The Chancellor was at the University to announce a new £36M UK government industrial strategy funding for clean energy innovation in the construction sector.

Latest applications note

Published: 
February 27th 2018
In a new applications note generated in collaboration with Lancaster University we demonstrate the quantification of layer composition in compound semiconductors of a vertical cavity surface emitting laser (VCSELs). XPS and Ar gas cluster sputter depth profiling has been used to determine the composition of the GaAs / AlxGa1-xAs layers.