As the dust settles on another AVS, we review the highlights of the meeting. Colleagues were busy at the exhibition, with over 10 instrument demos performed over the 3 days. The oral contributions were well received, generating significant discussion. There's the possibility to download our poster presentation.
We've recently published a new applications note, X-ray study of a copper-based biocidal film. This work was conducted in collaboration with Dr. Heather Yates at the School of Science, Engineering and Environment, University of Salford, Manchester.
We've just shipped our 200th AXIS Supra generation X-ray photoelectron spectrometer. We're understandably proud of this milestone. The success of the AXIS Supra+ is built on over 50 years of experience in developing surface analysis instruments.
In a recently published article we have spoken to a number of our academic and industrial Users and asked what they use their instrument for. It's not difficult to conclude that XPS is one of the primary analytical tools used for materials characterisation.
The latest version of ESCApe Acquisition and Processing software is now available for systems already running on this software. It is important that ESCApe Users to upgrade to this latest version to benefit from additional software functionality.
We're exhibiting at ECASIA at the end of May. It offers the perfect opportunity for anyone interested in the latest developments from Kratos Analytical to discuss them face-to-face with Sales and Applications specialists. We're also presenting HAXPES Applications and Composition Analyses of Surface and Sub-Surface Interfaces - our latest work from our applications lab.
It is with great sadness that we have learned of the death of Dr Martin Seah MBE in early June. Martin's career directly contributed to the success of the Kratos' surface analysis business group, establishing XPS as the primary technique for chemical surface characterisation. Whilst we mourn the loss, we also celebrate the significant contributions that Martin made to the advancement of XPS, AES and the surface analysis community.
Thank you to our German Users who contributed to a successful meeting at the end of May. It was good to learn of the work both our established and newest Users are producing using Kratos AXIS instruments. It’s always fascinating to learn of the breadth research undertaken, from soil analysis to metrology standards.